MIV-X
Make It Visible!
Visualizing Cracks, Voids, Delamination, and Other Hidden Defects Normally Impossible to Check Visually
Anyone Can Quickly and Easily Perform a Visual Surface Inspection
Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
- Simply attach the ultrasonic oscillator to the sample, and position the camera above the inspection surface.
- The propagation of the ultrasound is quickly displayed, and flaws are easily identified from the video.
- The easy-to-operate software is enhanced with functions to mark the flaws and measure the size easily.
- The lineup includes an optional optical zoom set, which can detect smaller flaws.
Utilized in Various Industries
Ultrasonic optical flaw detection enables the visualization of internal flaws (at a depth of about 1 mm) that are hard to find using conventional ultrasonic testing. It can easily detect flaws in joints and bonding surfaces in research and development processes involving multi-materials, which are created by combining different materials to increase strength and reduce weight.
Features
Shimadzu's proprietary light imagining technique
With ultrasonic optical flaw detection technology, the sample is encouraged the displacement of the surface is detected optically, and the propagation of the ultrasonic wave on the surface is observed.
Difference from Ultrasonic Flaw Detection
The MIV-X Ultrasonic Optical Flaw Detector assists with regions where ultrasonic testing (UT) is difficult. Leave the non-destructive inspection of surfaces and near surfaces to MIV-X!
Noise Removal Function Simplifies Defect Identification
The instrument is equipped with a function to digitally remove noise in the window showing the propagation of the ultrasound, simplifying flaw identification.
Dimension Display and Marking Functions Simplify Identification of Defect Position and Size
The instrument is equipped with a user interface that simplifies operations, such as displaying a scale (ruler) on acquired images of cracks and peeling and measuring the distance between two selected points.
Optical Zoom Set (Optionally Available) for Detecting Smaller Defects
Decreases the minimum detection size by a factor of approximately two (MIV-X standard: From approximately 1 mm dia. to 0.5 mm dia.)
Laser optical axis adjustment is also possible, improving irradiation uniformity
Brochures
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